Mr.TPL: A Method for Multi-Pin Net Router in Triple Patterning Lithography
Triple patterning lithography (TPL) has been recognized as one of the most promising solutions to print critical features in advanced technology nodes. A critical challenge within TPL is the effective assignment of the layout to masks. Recently, various layout decomposition methods and TPL-aware routing methods have been proposed to consider TPL. However, these methods typically result in numerous conflicts and stitches, and are mainly designed for 2-pin nets. This paper proposes a multipin net routing method in triple patterning lithography, called Mr.TPL. Experimental results demonstrate that Mr.TPL reduces color conflicts by 81.17%, decreases stitches by 76.89%, and achieves up to $5.4 \times$ speed improvement compared to the state-of-the-art TPL-aware routing method.
Authors
- Weiqing Ji (ORCID: https://orcid.org/0009-0009-0328-4241)
- Chengkai Wang (ORCID: https://orcid.org/0009-0002-7953-2925)
- Ning Zhu (ORCID: https://orcid.org/0000-0001-8891-6010)
- Hailong Yao (ORCID: https://orcid.org/0000-0002-8750-3086)
- Zhiyang Chen (ORCID: https://orcid.org/0009-0002-8460-2633)
- Fei Li (ORCID: https://orcid.org/0000-0002-3616-7860)
- Mingyang Kou
Institutions
- University of Science and Technology Beijing (CN)
- Tsinghua University (CN)
Publication Details
- Published
- 2025-06-22
- DOI
- https://doi.org/10.1109/dac63849.2025.11132965
- Primary Topic
- Advancements in Photolithography Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00