Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection

Recently, machine learning-based techniques have been applied for layout hotspot detection. However, existing methods encounter challenges in capturing the decision boundary across the entire dataset and ignore the geometric properties and topology of the polygons. In this paper, we introduce CLI-HD, a novel contrastive learning framework on layout sequences and images for hotspot detection. Our framework improves the ability to distinguish between hotspots and non-hotspots by similarity computations instead of a single decision boundary. To effectively incorporate geometric information into the model training process, we propose Layout2Seq, which encodes polygon shapes as vectors within sequences that are subsequently fed into the CLIHD. Furthermore, to better represent topology information, we develop an absolute position embedding, replacing the standard position encoders used in Transformer architectures. Extensive evaluations on various benchmarks demonstrate that CLI-HD outperforms current state-of-the-art methods, with an accuracy improvement ranging from $0.82 \%$ to $4.77 \%$ and a reduction in false alarm rates by $\mathbf{4. 9 \%}$ to $\mathbf{2 3. 1 8 \%}$.

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Publication Details

Published
2025-06-22
DOI
https://doi.org/10.1109/dac63849.2025.11133380
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
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article

Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection

Silin Chen, Ningmu Zou, Kangjian Di, Guohao Wang et al.
Industrial Vision Systems and Defect Detection
article

Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection

Silin Chen, Ningmu Zou, Kangjian Di, Guohao Wang, Li Du, W. Z. Zhao
article en

Abstract

Recently, machine learning-based techniques have been applied for layout hotspot detection. However, existing methods encounter challenges in capturing the decision boundary across the entire dataset and ignore the geometric properties and topology of the polygons. In this paper, we introduce CLI-HD, a novel contrastive learning framework on layout sequences and images for hotspot detection. Our framework improves the ability to distinguish between hotspots and non-hotspots by similarity computations instead of a single decision boundary. To effectively incorporate geometric information into the model training process, we propose Layout2Seq, which encodes polygon shapes as vectors within sequences that are subsequently fed into the CLIHD. Furthermore, to better represent topology information, we develop an absolute position embedding, replacing the standard position encoders used in Transformer architectures. Extensive evaluations on various benchmarks demonstrate that CLI-HD outperforms current state-of-the-art methods, with an accuracy improvement ranging from $0.82 \%$ to $4.77 \%$ and a reduction in false alarm rates by $\mathbf{4. 9 \%}$ to $\mathbf{2 3. 1 8 \%}$.

Nanjing University (CN)
Openalex Percentile: Top 65%
Industrial Vision Systems and Defect Detection
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Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection — Silin Chen, Ningmu Zou, et al. · (2025) | TGRS Research Map | TGRS