SSDL-ILT: Efficient ILT utilizing a self-supervised deep learning model
Inverse lithography technology (ILT) is an advanced resolution enhancement technique that achieves mask optimization at the pixel level. However, application of ILT is hindered by time-intensive physical simulation. Herein, we propose an efficient ILT algorithm leveraging a deep learning model. A novel loss function is constructed to guide the model training in a self-supervised manner, eliminating the requirement of labelled data that might be nontrivial to acquire. The trained model outputs final mask patterns without further ILT optimization. Sub-resolution assist features (SRAFs) are generated automatically, the complexity of which can be adjusted during the training process to control mask manufacturability. The model was trained and validated on ICCAD-2013 CAD contest dataset. Better pattern fidelity and up to 12,000 times speedup are observed compared to other SOTA models. The trained model also shows good generalization ability to geometrically-different design patterns from another dataset, via a few-shot learning approach.
Authors
- Rui Xu (ORCID: https://orcid.org/0000-0002-5899-2503)
- Haoxiang Jiang (ORCID: https://orcid.org/0000-0003-1191-1398)
- Junqi Yang (ORCID: https://orcid.org/0000-0003-3234-9875)
- Ming Fang (ORCID: https://orcid.org/0000-0002-5064-4598)
Institutions
- Shanghai Jiao Tong University (CN)
- Shanghai Zhangjiang Laboratory (CN)
Publication Details
- Published
- 2025-06-22
- DOI
- https://doi.org/10.1109/dac63849.2025.11133136
- Primary Topic
- Power Systems and Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00