DCM-PL technique to investigate charge carrier and exciton dynamics in organic light-emitting diodes

Understanding the correlation between charge accumulation properties and exciton dynamics in OLEDs is crucial for optimizing device performance. In particular, the charge distribution near the emission layer affects both device efficiency and lifetime, as it influences the emission zone and exciton-polaron quenching (EPQ) characteristics. In this study, we employed a displacement current measurement combined with photoluminescence intensity measurement (DCM-PL) to investigate charge carrier and exciton dynamics in Ir-complex and 4CzIPN-based OLEDs. The DCM-PL technique effectively captures exciton-charge interactions, including EPQ and exciton dissociation, providing valuable insights into their behaviors in actual OLED devices.