Dynamic response characteristics of Rydberg atoms under the action of electric fields ranging from DC to 50 kHz and electric field measurement method
Abstract Rydberg atoms will produce the Stark effect under the action of non-resonant electric fields. Due to Rydberg atoms’ inherent energy level characteristics, they show sensitivity to electric fields and excellent self-calibration, which makes them promising in electric field measurement. In this paper, an experimental platform is established by fixing the probe and coupling laser frequencies. The ‘amplitude attenuation’ phenomenon of resonance point laser intensity oscillation caused by the change of electric field frequency is observed and analyzed, and its evolution trend is clarified; then, in different frequency bands (Hz band and kHz band), the density matrix equations are constructed and solved respectively in combination with the atomic energy level excitation structure, through which the dynamic response characteristics between atoms and AC electric fields are revealed. Finally, this paper proposes the Hz band electric field measurement method and the kHz band electric field measurement method: (1) in the steady-state solution of the electromagnetically induced transparency (EIT)-Stark mathematical model, the laser intensity curve at the resonance point laser intensity is inverted into an electric field waveform in real time to achieve Hz electric field measurement based on Rydberg atoms; (2) in the non-steady-state solution of the EIT-Stark mathematical model, the electric field amplitude is predicted by identifying the laser intensity amplitude and frequency at the laser intensity curve with the help of a neural network, thus achieving kHz electric field measurement based on Rydberg atoms. Experimental results show that the accuracy of the Hz band electric field measurement method proposed in this paper is greater than 99%, and the accuracy of the kHz band electric field measurement method is greater than 96%.
Authors
- Feng Pan (ORCID: https://orcid.org/0000-0003-2820-768X)
- Hao Wang (ORCID: https://orcid.org/0000-0001-8869-9669)
- Sheng Yan
- Huaiqing Zhang (ORCID: https://orcid.org/0000-0003-2957-1520)
Institutions
- Chongqing University (CN)
Publication Details
- Journal
- Journal of Physics D Applied Physics
- Published
- 2025-09-09
- DOI
- https://doi.org/10.1088/1361-6463/ae04f4
- Primary Topic
- Scientific Measurement and Uncertainty Evaluation
- Type
- article
- Field-Weighted Citation Impact
- 0.00