Enhanced Accuracy of Measurements in Automated Test Equipment for Electronic Component Verification

Automated Test Equipment (ATE) plays a critical role in the electronic manufacturing industry by automating the testing and validation of electronic components, circuits, and systems. ATE systems are made to guarantee that devices are free of flaws and satisfy customer expectations based on performance criteria, which adds to their high quality and dependability. Reducing human error, boosting test throughput, and supplying accurate, real-time data for analysis are the main goals of ATE. With an emphasis on improving measurement accuracy and device quality, this study attempts to pinpoint enhancements for current ATE testers. The components used in the study were chosen for the DTI and API boards according to the tester's accuracy and skill. PSPICE was used to model these components, primarily resistors, capacitors, voltage amplifiers, and voltage dividers. The behavior of these elements, which ultimately affect the measurement of PE electronic pins by influencing the voltage input high (VIH), voltage input high (VIHH), and voltage input low (VIL) values, is examined by the suggested method. The values of the current parameter vary from 7V to 15V. Furthermore, since pin electronic (PE) pins can only withstand 7V and DPS can manage up to 15V, enhancements are suggested for the connection between the two pins. A COTO9XX relay mechanical switch is inserted between the VIH and VIHH levels of the device under testing (DUT) pin electronics to provide the necessary 12.5V for both sectors. A comparison between the simulation findings and the ATE tester's hardware measurements reveals an accuracy of roughly 90% in relation to the hardware configuration.

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Publication Details

Published
2025-08-27
DOI
https://doi.org/10.1109/inecce64959.2025.11151095
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

Enhanced Accuracy of Measurements in Automated Test Equipment for Electronic Component Verification

Yusmarnita Yusop, Mohd Ashraf Ahmad, N I Kamel, Khairuddin Osman et al.
VLSI and Analog Circuit Testing
article

Enhanced Accuracy of Measurements in Automated Test Equipment for Electronic Component Verification

Yusmarnita Yusop, Mohd Ashraf Ahmad, N I Kamel, Khairuddin Osman, Muhammad Azizi, Norzahirah Zainuddin
article en

Abstract

Automated Test Equipment (ATE) plays a critical role in the electronic manufacturing industry by automating the testing and validation of electronic components, circuits, and systems. ATE systems are made to guarantee that devices are free of flaws and satisfy customer expectations based on performance criteria, which adds to their high quality and dependability. Reducing human error, boosting test throughput, and supplying accurate, real-time data for analysis are the main goals of ATE. With an emphasis on improving measurement accuracy and device quality, this study attempts to pinpoint enhancements for current ATE testers. The components used in the study were chosen for the DTI and API boards according to the tester's accuracy and skill. PSPICE was used to model these components, primarily resistors, capacitors, voltage amplifiers, and voltage dividers. The behavior of these elements, which ultimately affect the measurement of PE electronic pins by influencing the voltage input high (VIH), voltage input high (VIHH), and voltage input low (VIL) values, is examined by the suggested method. The values of the current parameter vary from 7V to 15V. Furthermore, since pin electronic (PE) pins can only withstand 7V and DPS can manage up to 15V, enhancements are suggested for the connection between the two pins. A COTO9XX relay mechanical switch is inserted between the VIH and VIHH levels of the device under testing (DUT) pin electronics to provide the necessary 12.5V for both sectors. A comparison between the simulation findings and the ATE tester's hardware measurements reveals an accuracy of roughly 90% in relation to the hardware configuration.

Universiti Malaysia Pahang Al-Sultan Abdullah (MY), Technical University of Malaysia Malacca (MY), Kolej Poly-Tech MARA (MY), Aero Engine Corporation of China (China) (CN)
Openalex Percentile: Top 74%
VLSI and Analog Circuit Testing
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