Low Overshoot Fast Rising Pulse Current Source for Testing

Pulse technology is a fundamental cornerstone of modern electronics. With the advancement of high-power semiconductor driving technology, high-current pulse current sources have found extensive applications in testing, industrial, and military domains, playing a critical role. This paper compares two pulse current generation methods, selecting the closed-loop feedback pulse current source circuit as the foundational architecture for test-oriented pulse current generation. By implementing accelerating capacitor compensation, the system significantly reduces overshoot at the cost of slightly extended rise time. Additionally, a parameter selection methodology for compensation components is proposed, with simulation results validating the accuracy of this approach.