High Temperature Studies of Near-UV InGaN/GaN Laser Diodes

In this work, we investigate the effects of operation temperature on the emission spectra, lasing threshold current density, and slope efficiency of GaN UV-A laser diodes with cleaved mirror facets emitting at approximately 376 nm.

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Published
2025-08-13
DOI
https://doi.org/10.1109/rapid64712.2025.11151455
Primary Topic
GaN-based semiconductor devices and materials
Type
article
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High Temperature Studies of Near-UV InGaN/GaN Laser Diodes

Matthew Dwyer, Shubhra S. Pasayat, Matthew Seitz, Chirag Gupta et al.
GaN-based semiconductor devices and materials
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High Temperature Studies of Near-UV InGaN/GaN Laser Diodes

Matthew Dwyer, Shubhra S. Pasayat, Matthew Seitz, Chirag Gupta, Luke Mawst, Guangying Wang, Stephanie Smith, Cheng Liu, Jacob Boisvere, Jing Zhang, Qinchen Lin, Tom Earles
article en

Abstract

In this work, we investigate the effects of operation temperature on the emission spectra, lasing threshold current density, and slope efficiency of GaN UV-A laser diodes with cleaved mirror facets emitting at approximately 376 nm.

University of Wisconsin–Madison (US), Rochester Institute of Technology (US)
Openalex Percentile: Top 85%
GaN-based semiconductor devices and materials
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