Elucidating the Structural and Morphological Properties of Bi<sub>2</sub>Se<sub>3</sub> and Bi<sub>2</sub>Te<sub>3</sub> Thin Films
The structural and morphological properties of Bi<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>Se<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> and Bi<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>Te<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> thin films were characterized. The thin films are nonuniform with c-axis growth. The respective calculated lattice parameters, 28.554 Å and 29.991 Å, are lower compared to standard values and confirm the presence of incomplete quintuple layers.
Authors
- N. Sheremet (ORCID: https://orcid.org/0000-0001-6955-1095)
- В. Н. Шеремет (ORCID: https://orcid.org/0000-0003-0840-5312)
- Md Fazle Rabbe (ORCID: https://orcid.org/0000-0002-3135-2776)
- Md. Sojib (ORCID: https://orcid.org/0000-0002-5906-2076)
- Julian A. Bobb (ORCID: https://orcid.org/0000-0002-8536-553X)
- Nibir K. Dhar (ORCID: https://orcid.org/0000-0002-6663-2209)
- Mavlanjan Rahman
Institutions
- Virginia Commonwealth University (US)
Publication Details
- Published
- 2025-08-13
- DOI
- https://doi.org/10.1109/rapid64712.2025.11151524
- Primary Topic
- Topological Materials and Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00