Optical and Electrical Hybrid Nanoscopy for Low Dimensional Materials

We present a theoretical and experimental investigation of the optical and electrical responses of lowdimensional materials with sub- 10 nm spatial resolution, employing hybrid nanoscopy via force detection. By integrating multifrequency atomic force microscopy techniques, we combine photo-induced force microscopy with electrostatic/Kelvin probe force microscopy to simultaneously measure both the nano-IR response and the electrostatic/surface potential of low-dimensional materials. The capability of AFM to perform nanometer-scale electrical and optical spectroscopic analysis offers new opportunities in materials science and technology, ranging from dopant calibration to polariton studies, by providing a deeper understanding of the optical and electrical properties of individual low-dimensional materials.