Zinc Diffusion Technique for Fabrication of Narrow Band Infrared Detectors

Diffusion technique was used to fabricate planar type II superlattice infrared photodetectors. In this work, we present mid-wavelength infrared photodetectors based on III-V InAs/InAs<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1-x</inf>Sb<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</inf> superlattice. Metal Organic Chemical Vapor Deposition growth technique was used to grow the material and perform the diffusion. Zinc was used as a p-type dopant for junction generation. Fabrication technique, diffusion process along with the electrical and optical performance of the planar devices are presented.

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Publication Details

Published
2025-08-13
DOI
https://doi.org/10.1109/rapid64712.2025.11151429
Primary Topic
Advanced Semiconductor Detectors and Materials
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article
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article

Zinc Diffusion Technique for Fabrication of Narrow Band Infrared Detectors

Arash Dehzangi, Jiakai Li
Advanced Semiconductor Detectors and Materials
article

Zinc Diffusion Technique for Fabrication of Narrow Band Infrared Detectors

Arash Dehzangi, Jiakai Li
article en

Abstract

Diffusion technique was used to fabricate planar type II superlattice infrared photodetectors. In this work, we present mid-wavelength infrared photodetectors based on III-V InAs/InAs<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1-x</inf>Sb<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</inf> superlattice. Metal Organic Chemical Vapor Deposition growth technique was used to grow the material and perform the diffusion. Zinc was used as a p-type dopant for junction generation. Fabrication technique, diffusion process along with the electrical and optical performance of the planar devices are presented.

The University of Texas at Dallas (US), Applied Optoelectronics (United States) (US)
Openalex Percentile: Top 77%
Advanced Semiconductor Detectors and Materials
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