Drop simulation analysis and experimental verification of a certain packaging box

Abstract Through theoretical analysis and simulation of the packaging box under drop conditions, stress cloud diagrams and stress-time history curves were obtained during edge and corner drop impacts. The results indicate that the maximum stress experienced by the packaging box is below the material’s yield limit. Drop tests confirmed that the box structure remained intact with no damage or deformation, and the experimental data aligned well with simulation results. The simulation analysis is validated as reasonable, demonstrating that the packaging box design meets the required specifications.

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Publication Details

Journal
Journal of Physics Conference Series
Published
2025-09-01
DOI
https://doi.org/10.1088/1742-6596/3098/1/012011
Primary Topic
Material Properties and Processing
Type
article
Field-Weighted Citation Impact
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article

Drop simulation analysis and experimental verification of a certain packaging box

R. S. Liu, Jiacheng Zhou, Yonghui Li
Journal of Physics Conference Series
Material Properties and Processing
article

Drop simulation analysis and experimental verification of a certain packaging box

R. S. Liu, Jiacheng Zhou, Yonghui Li
article en

Abstract

Abstract Through theoretical analysis and simulation of the packaging box under drop conditions, stress cloud diagrams and stress-time history curves were obtained during edge and corner drop impacts. The results indicate that the maximum stress experienced by the packaging box is below the material’s yield limit. Drop tests confirmed that the box structure remained intact with no damage or deformation, and the experimental data aligned well with simulation results. The simulation analysis is validated as reasonable, demonstrating that the packaging box design meets the required specifications.

Journal of Physics Conference SeriesVol. 3098(1)
China Shipbuilding Industry Corporation (China) (CN)
Openalex Percentile: Top 73%
Material Properties and Processing
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Drop simulation analysis and experimental verification of a certain packaging box — R. S. Liu, Jiacheng Zhou, et al. · Journal of Physics Conference Series (2025) | TGRS Research Map | TGRS