Editorial

The IEEE International Integrated Reliability Workshop (IIRW) is an annual, four-day event that brings together reliability researchers, professionals, and students from all over the world.

Authors

Institutions

Publication Details

Journal
IEEE Transactions on Device and Materials Reliability
Published
2025-09-01
DOI
https://doi.org/10.1109/tdmr.2025.3597355
Primary Topic
Power System Reliability and Maintenance
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Editorial

Cristian Zambelli
5 links
IEEE Transactions on Device and Materials Reliability
Power System Reliability and Maintenance
article

Editorial

Cristian Zambelli
article en

Abstract

The IEEE International Integrated Reliability Workshop (IIRW) is an annual, four-day event that brings together reliability researchers, professionals, and students from all over the world.

IEEE Transactions on Device and Materials ReliabilityVol. 25(3)
University of Ferrara (IT)
Openalex Percentile: Top 70%
Power System Reliability and Maintenance
DOISourceOpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Editorial — Cristian Zambelli · IEEE Transactions on Device and Materials Reliability (2025) | TGRS Research Map | TGRS