MBE growth of GaSb on Ge-based templates grown on Si for mid-infrared photonics [Invited]

We study the molecular beam epitaxy of GaSb layers on Ge-based templates grown on Si substrates by low-energy plasma-enhanced chemical vapor deposition. First, we study the growth mechanism to obtain a GaSb surface free of emerging antiphase boundaries on Ge substrates, and then we transfer this mechanism to Ge-based templates. Our investigations reveal that this mechanism is hindered by the crosshatch pattern formed during the Ge-based template growth. We demonstrate that using low-miscut (1°) Si substrates or chemical-mechanical polishing mitigates the effects of the crosshatch pattern, enabling the growth of GaSb layers free of emerging antiphase boundaries. These results represent a further step towards the monolithic integration of III-V on mid-infrared photonic platforms.

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Publication Details

Journal
Optical Materials Express
Published
2025-09-10
DOI
https://doi.org/10.1364/ome.569432
Citations
1
Primary Topic
Photonic and Optical Devices
Type
article
Field-Weighted Citation Impact
0.73
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article

MBE growth of GaSb on Ge-based templates grown on Si for mid-infrared photonics [Invited]

Stefano Calcaterra, Jean‐Baptiste Rodriguez, Afonso DE CERDEIRA OLIVEIRA, Audrey Gilbert et al.
1 citations
Optical Materials Express
Photonic and Optical Devices
0.73
article

MBE growth of GaSb on Ge-based templates grown on Si for mid-infrared photonics [Invited]

Stefano Calcaterra, Jean‐Baptiste Rodriguez, Afonso DE CERDEIRA OLIVEIRA, Audrey Gilbert, Eric Tournié, Giovanni Isella, Mary Claire Silvestre, Davide Impelluso, Sébastien Lacaze
article en
1 citations

Abstract

We study the molecular beam epitaxy of GaSb layers on Ge-based templates grown on Si substrates by low-energy plasma-enhanced chemical vapor deposition. First, we study the growth mechanism to obtain a GaSb surface free of emerging antiphase boundaries on Ge substrates, and then we transfer this mechanism to Ge-based templates. Our investigations reveal that this mechanism is hindered by the crosshatch pattern formed during the Ge-based template growth. We demonstrate that using low-miscut (1°) Si substrates or chemical-mechanical polishing mitigates the effects of the crosshatch pattern, enabling the growth of GaSb layers free of emerging antiphase boundaries. These results represent a further step towards the monolithic integration of III-V on mid-infrared photonic platforms.

Optical Materials ExpressVol. 15(10)
Politecnico di Milano (IT)
Openalex Percentile: Top 24%
Photonic and Optical Devices
0.73
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