Plasticity Mechanisms in Nanostructured Cubic Boron Nitride: Internal Defects and Amorphous Layers
Nanostructured cubic boron nitride (NS-cBN) has attracted significant attention due to its high hardness and excellent thermal stability, yet a systematic strategy to balance strength and toughness through atomically structural design remains elusive. Here, we integrate plasticity theory with large-scale atomistic simulations to elucidate the size-dependent roles of internal defects, i.e., twin boundaries (TBs), stacking faults (SFs), and dislocation networks, and amorphous interfacial layers (AILs) in NS-cBN. In samples containing TBs and SFs, we demonstrate uniquely that the competition between hard slip modes (e.g., dislocation penetration) and soft slip modes (e.g., sliding parallel to defects), together with grain-boundary sliding, governs the scaling of strength and crack-initiation strain. Specially, a cross-slip of 1/2[110] screw dislocations emerges as the dominant plastic mechanism penetrating planar defects, while high-density SFs leverage stress concentration to activate the destacking fault mechanism, thereby improving crack-initiation strain with high strength. Introducing pre-existing dislocation networks shifts deformation from a grain-boundary-dominated to a dislocation-dominated regime, achieving a 76% increase in failure strain (up to 15% compressive strain) and a metal-like plastic plateau at a dislocation density of 0.115 nm<sup>-2</sup>. Moreover, a 0.5 nm-thick AIL is found to simultaneously enhance strength and toughness by homogenizing stress, suppressing shear bands, and crack-initiation; further thickening of the AIL leads to softening, while increasing its density or bond strength amplifies its reinforcing effect. By synergistically tailoring internal defects and AILs, we achieve NS-cBN materials that combine high strength with high toughness, and thereby, we establish general design principles to guide the development of next-generation superhard materials.
Authors
- Tengfei Xu (ORCID: https://orcid.org/0009-0001-3452-8036)
- Dominik Legut (ORCID: https://orcid.org/0000-0001-9185-9934)
- Ai Lian Geng (ORCID: https://orcid.org/0000-0002-3721-7356)
- Ruifeng Zhang (ORCID: https://orcid.org/0000-0002-9905-7271)
- Jianfeng Zhang (ORCID: https://orcid.org/0000-0002-3270-0533)
- Zhaorui Liu
Institutions
- VSB - Technical University of Ostrava (CZ)
- Charles University (CZ)
- Beihang University (CN)
- Ministry of Industry and Information Technology (CN)
Publication Details
- Journal
- ACS Applied Materials & Interfaces
- Published
- 2025-09-08
- DOI
- https://doi.org/10.1021/acsami.5c10992
- Primary Topic
- Boron and Carbon Nanomaterials Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00