AI-Based Design of an Efficient Final Test Scheme
This paper proposes an AI-based optimization solution to address the efficiency and cost challenges in the Final Test (FT) of semiconductor testing. Previous experiments indicate that a test throughput can be enhanced by 44.13% through multi-site dynamic load balancing, adaptive test algorithms and mixed-signal hierarchical test strategies.
Authors
- Chunmei Pei
- Shuo Wang (ORCID: https://orcid.org/0000-0002-7907-9676)
- Guoying Wang (ORCID: https://orcid.org/0000-0001-8142-7652)
- Zhu Gongsheng
Institutions
- Beijing University of Technology (CN)
- Beijing Polytechnic (CN)
Publication Details
- Published
- 2025-04-28
- DOI
- https://doi.org/10.1109/icaidt66272.2025.00107
- Primary Topic
- Engineering and Test Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00