Recovering optimal precision in quantum sensing with time domain imperfections
Device imperfections can significantly hinder the application of quantum metrology, inevitably introducing bias in estimation. This work demonstrates, both theoretically and experimentally, that properly engineered quantum control, albeit imperfect, can unlock the ultimate precision of practical quantum metrology.
Authors
- Dawei Lu (ORCID: https://orcid.org/0000-0003-0462-7225)
- Yuxiang Yang (ORCID: https://orcid.org/0000-0002-0531-8929)
- Xinyue Long
- Zi-Shen Li
- Xiaodong Yang (ORCID: https://orcid.org/0000-0003-4509-6045)
Institutions
- Shenzhen University (CN)
- Southern University of Science and Technology (CN)
- Quantum Science Center of Guangdong-Hong Kong-Macao Greater Bay Area (CN)
- University of Hong Kong (HK)
Publication Details
- Journal
- Physical review. A/Physical review, A
- Published
- 2025-08-18
- DOI
- https://doi.org/10.1103/xbrk-357g
- Primary Topic
- Quantum Information and Cryptography
- Type
- article
- Field-Weighted Citation Impact
- 0.00