Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives
THE 3D NAND Flash technology is the primary storage medium within Solid State Drives (SSDs) [1]. Its scalability demonstrated numerous advantages in terms of storage density compared to traditional planar NAND [2]. The reliability assessment of this storage medium primarily considers endurance, retention, and disturb immunity at various operating temperatures [3].
Authors
- Rino Micheloni (ORCID: https://orcid.org/0000-0002-3400-2624)
- Cristian Zambelli (ORCID: https://orcid.org/0000-0001-8755-0504)
Institutions
- University of Ferrara (IT)
- Accademia Italiana Medicina Osteopatica (IT)
Publication Details
- Journal
- IEEE Design and Test
- Published
- 2025-09-04
- DOI
- https://doi.org/10.1109/mdat.2025.3606347
- Primary Topic
- Advanced Data Storage Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00