Simplifying <i>in vacuo</i> optical measurements of CVD processes using vacuum-compatible optical fibers
In situ optical measurements during chemical vapor deposition processes can offer insight into the chemical reactions and electronic phenomena that are occurring during a process. However, the tooling to make these measurements can be complex, difficult to align, and may even require a redesign of the entire vacuum deposition chamber. Herein, we present a setup that allows for in situ optical measurements using vacuum-compatible fiber optics that only requires a singular conflat feedthrough, eliminating the need for optical viewports and alignment of external light sources/detectors. Proof of performance is shown with a neutral density filter and an exemplary application of vapor doping a conjugated polymer (poly-3-hexylthiophene) using vapor-phase TiCl4.
Authors
- Li Zhang (ORCID: https://orcid.org/0000-0001-9110-6481)
- Mark D. Losego (ORCID: https://orcid.org/0000-0002-9810-9834)
Institutions
- Georgia Institute of Technology (US)
- Université Bourgogne Franche-Comté (FR)
Publication Details
- Journal
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Published
- 2025-09-01
- DOI
- https://doi.org/10.1116/6.0004789
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00