Low-Noise Amplifier Design: DC, Transient and Noise Analysis across CMOS Technologies

The paper discusses the design and simulation of the performance of a low noise amplifier (LNA) using 45nm CMOS technology. DC, transient and noise to enhance our understanding of circuit performance. Theoretical formulations of power consumption, switching time, and noise figure are validated with Cadence simulation to ensure accuracy in predicting actual performance. The research demonstrates that the 45nm technology node offers high-speed operation and superior noise performance, which is extremely well suited for RF applications where signal integrity and efficiency are paramount. The effect of transistor scaling on device parameters such as threshold voltage, mobility, and parasitic capacitance is also addressed. The results show that even though 45nm technology is better in performance with respect to speed and noise reduction, it comes at the disadvantage of higher power dissipation. The research highlights the trade-offs in the LNA design and provides a glimpse of performance optimization for state-of-the-art CMOS nodes. Future research may include process variation analysis and additional circuit improvements for high-power efficiency without compromising high-frequency stability.

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Publication Details

Published
2025-05-09
DOI
https://doi.org/10.1109/icepe65965.2025.11139807
Citations
2
Primary Topic
Radio Frequency Integrated Circuit Design
Type
article
Field-Weighted Citation Impact
1.46
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article

Low-Noise Amplifier Design: DC, Transient and Noise Analysis across CMOS Technologies

D Madhumitha, M. Satya Sai Ram, T. Thamaraimanalan, R S Shivanandham
2 citations
Radio Frequency Integrated Circuit Design
1.46
article

Low-Noise Amplifier Design: DC, Transient and Noise Analysis across CMOS Technologies

D Madhumitha, M. Satya Sai Ram, T. Thamaraimanalan, R S Shivanandham
article en
2 citations

Abstract

The paper discusses the design and simulation of the performance of a low noise amplifier (LNA) using 45nm CMOS technology. DC, transient and noise to enhance our understanding of circuit performance. Theoretical formulations of power consumption, switching time, and noise figure are validated with Cadence simulation to ensure accuracy in predicting actual performance. The research demonstrates that the 45nm technology node offers high-speed operation and superior noise performance, which is extremely well suited for RF applications where signal integrity and efficiency are paramount. The effect of transistor scaling on device parameters such as threshold voltage, mobility, and parasitic capacitance is also addressed. The results show that even though 45nm technology is better in performance with respect to speed and noise reduction, it comes at the disadvantage of higher power dissipation. The research highlights the trade-offs in the LNA design and provides a glimpse of performance optimization for state-of-the-art CMOS nodes. Future research may include process variation analysis and additional circuit improvements for high-power efficiency without compromising high-frequency stability.

Sri Eshwar College of Engineering
Openalex Percentile: Top 15%
Radio Frequency Integrated Circuit Design
1.46
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