ASiM: Modeling and Analyzing Inference Accuracy of SRAM-Based Analog CiM Circuits
Static random-access memory (SRAM)-based analog compute-in-memory (ACiM) demonstrates promising energy efficiency for deep neural network (DNN) processing. Nevertheless, efforts to optimize efficiency frequently compromise accuracy, and this trade-off remains insufficiently studied due to the difficulty of performing full-system validation. Specifically, existing simulation tools rarely target SRAM-based ACiM and exhibit inconsistent accuracy predictions, highlighting the need for a standardized, SRAM compute-in-memory (CiM) circuit-aware evaluation methodology. This article presents ASiM, a simulation framework for evaluating inference accuracy in SRAM-based ACiM systems. ASiM captures critical effects in SRAM-based analog compute in memory systems, such as analog-to-digital converter (ADC) quantization, bit-parallel encoding, and analog noise, which must be modeled with high fidelity due to their distinct behavior in charge-domain architectures compared to other memory technologies. ASiM supports a wide range of modern DNN workloads, including CNN and Transformer-based models such as ViT, and scales to large-scale tasks like ImageNet classification. Our results indicate that bit-parallel encoding can improve energy efficiency with only modest accuracy degradation; however, even 1 LSB of analog noise can significantly impair inference performance, particularly in complex tasks such as ImageNet. To address this, we explore hybrid analog-digital execution and majority voting schemes, both of which enhance robustness without negating energy savings. ASiM bridges the gap between hardware design and inference performance, offering actionable insights for energy-efficient, high-accuracy ACiM deployment. The code is available at <uri xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">https://github.com/Keio-CSG/ASiM</uri>
Authors
- Kentaro Yoshioka (ORCID: https://orcid.org/0000-0001-5640-2250)
- Wenlun Zhang (ORCID: https://orcid.org/0000-0003-1570-082X)
- Yung-Chin Chen
- Shimpei Ando
Institutions
- Keio University (JP)
Publication Details
- Journal
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Published
- 2025-09-05
- DOI
- https://doi.org/10.1109/tvlsi.2025.3605286
- Citations
- 2
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 1.46