Robust terahertz polarization analysis based on a unit-scale polarization-multiplexed metasurface
In the terahertz band corresponding to molecular vibration-rotation transitions, polarization encodes rich material information, rendering polarization analysis crucial for sensing and imaging. To overcome limitations of existing methods, including reliance on multiple components, susceptibility to non-uniformity, and complex polarization information extraction processes, we propose a new method, to the best of our knowledge, for polarization analysis through a single polarization-multiplexed metasurface. By independently focusing <i>x</i>-, <i>y</i>-, 45-, and left-handed circular polarization into four spots, a linear mapping between the spot intensities and Stokes parameters is established via a calibrated measurement matrix. Leveraging precise Jones matrix engineering and wavelength-scale meta-atom polarization multiplexing, arbitrary polarization states are accurately reconstructed with resilience to illumination non-uniformity. This method holds significant promise for terahertz polarization analysis and imaging applications.
Authors
- Julian Cheng (ORCID: https://orcid.org/0000-0001-6310-8236)
- Fei Fan (ORCID: https://orcid.org/0000-0001-7763-1992)
- Shengjiang Chang (ORCID: https://orcid.org/0000-0001-7127-4728)
- Yu Wang (ORCID: https://orcid.org/0000-0002-8159-8723)
Institutions
- Nankai University (CN)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-09-05
- DOI
- https://doi.org/10.1364/ol.572982
- Citations
- 1
- Primary Topic
- Metamaterials and Metasurfaces Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.43