On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)

Microwave Absorbing Materials In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.

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Publication Details

Journal
Advanced Electronic Materials
Published
2025-09-01
DOI
https://doi.org/10.1002/aelm.70084
Primary Topic
Material Properties and Applications
Type
article
Field-Weighted Citation Impact
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article

On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)

Peng Wu, Yanfei Sheng, Liang Qiao, Shengyu Yang et al.
Advanced Electronic Materials
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article

On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)

Peng Wu, Yanfei Sheng, Liang Qiao, Shengyu Yang, Yiwen Dong, Zhiwei Li, Tao Wang, Fashen Li
article en

Abstract

Microwave Absorbing Materials In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.

Advanced Electronic MaterialsVol. 11(14)
Ministry of Education (RW)
Openalex Percentile: Top 63%
Material Properties and Applications
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