On the Quality Criteria for Microwave Absorbing Materials (Adv. Electron. Mater. 14/2025)
Microwave Absorbing Materials In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.
Authors
- Peng Wu (ORCID: https://orcid.org/0000-0001-7031-410X)
- Yanfei Sheng (ORCID: https://orcid.org/0000-0001-5235-5610)
- Liang Qiao (ORCID: https://orcid.org/0000-0002-6226-6010)
- Shengyu Yang (ORCID: https://orcid.org/0009-0001-9203-8668)
- Yiwen Dong (ORCID: https://orcid.org/0009-0002-6813-6783)
- Zhiwei Li (ORCID: https://orcid.org/0000-0001-8932-5634)
- Tao Wang (ORCID: https://orcid.org/0000-0002-7576-131X)
- Fashen Li
Institutions
- Ministry of Education (RW)
Publication Details
- Journal
- Advanced Electronic Materials
- Published
- 2025-09-01
- DOI
- https://doi.org/10.1002/aelm.70084
- Primary Topic
- Material Properties and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00