MFIT : Multi-FIdelity Thermal Modeling for 2.5D and 3D Multi-Chiplet Architectures
Rapidly evolving artificial intelligence and machine learning applications require ever-increasing computational capabilities, while monolithic 2D design technologies approach their limits. 2.5D/3D heterogeneous integration of smaller chiplets using advanced packaging has emerged as a promising paradigm for addressing this limit and meeting performance demands. These approaches offer a significant cost reduction and higher manufacturing yield than monolithic 2D integrated circuits. However, the compact arrangement and high compute density of these systems exacerbate thermal management challenges, potentially compromising performance. Addressing these thermal modeling challenges is critical, especially as system sizes grow and different design stages require varying levels of accuracy and speed. Since no single thermal modeling technique meets all these needs, this article introduces MFIT, a range of multi-fidelity thermal models that effectively balance accuracy and speed. These multi-fidelity models can enable efficient design space exploration and runtime thermal management. Our extensive testing on systems with 16, 36, and 64 2.5D integrated chiplets and 16×3 3D integrated chiplets demonstrates that these models can reduce execution times from days to mere seconds and milliseconds with negligible loss in accuracy.
Authors
- Alish Kanani (ORCID: https://orcid.org/0009-0000-8585-9241)
- Eric J. Tervo (ORCID: https://orcid.org/0000-0002-8517-9649)
- Lukas Pfromm (ORCID: https://orcid.org/0000-0002-7905-9843)
- Janardhan Rao Doppa (ORCID: https://orcid.org/0000-0002-3848-5301)
- Harsh Sharma (ORCID: https://orcid.org/0000-0002-0334-4269)
- Partha Pratim Pande (ORCID: https://orcid.org/0000-0002-5930-8531)
- Ümit Y. Ogras (ORCID: https://orcid.org/0000-0002-5045-5535)
- Jaehyun Park (ORCID: https://orcid.org/0000-0002-2276-4998)
- Parth Solanki
Institutions
- University of Wisconsin–Madison (US)
- University of Ulsan (KR)
- Washington State University (US)
Publication Details
- Journal
- ACM Transactions on Design Automation of Electronic Systems
- Published
- 2025-09-04
- DOI
- https://doi.org/10.1145/3765905
- Citations
- 8
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 5.84