Improvement of the Yield during Crystal Growth of SiC by PVT by Proper Selection and Design of Hot Zone Isolation Components

This work discusses three aspects of the PVT growth process to reach a higher SiC crystal yield: (i) Type of carbon isolation material and procedure to maintain reproducible growth conditions from one process to the next. (ii) The pros and cons of temperature and power control (or a mixture of both) during the SiC crystal growth phase of the PVT process; and (iii) the selection of a set of process parameters and the specifications of the grown SiC crystal, which serve as a fingerprint of reproducible growth conditions (related to the selection and design of hot zone isolation components).

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Publication Details

Journal
Materials science forum
Published
2025-09-04
DOI
https://doi.org/10.4028/p-qcdyf7
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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Improvement of the Yield during Crystal Growth of SiC by PVT by Proper Selection and Design of Hot Zone Isolation Components

Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle et al.
5 links
Materials science forum
Silicon Carbide Semiconductor Technologies
article

Improvement of the Yield during Crystal Growth of SiC by PVT by Proper Selection and Design of Hot Zone Isolation Components

Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle, Julian Zöcklein
article en

Abstract

This work discusses three aspects of the PVT growth process to reach a higher SiC crystal yield: (i) Type of carbon isolation material and procedure to maintain reproducible growth conditions from one process to the next. (ii) The pros and cons of temperature and power control (or a mixture of both) during the SiC crystal growth phase of the PVT process; and (iii) the selection of a set of process parameters and the specifications of the grown SiC crystal, which serve as a fingerprint of reproducible growth conditions (related to the selection and design of hot zone isolation components).

Materials science forumVol. 1156
Friedrich-Alexander-Universität Erlangen-Nürnberg (DE)
Openalex Percentile: Top 77%
Silicon Carbide Semiconductor Technologies
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