Improvement of the Yield during Crystal Growth of SiC by PVT by Proper Selection and Design of Hot Zone Isolation Components
This work discusses three aspects of the PVT growth process to reach a higher SiC crystal yield: (i) Type of carbon isolation material and procedure to maintain reproducible growth conditions from one process to the next. (ii) The pros and cons of temperature and power control (or a mixture of both) during the SiC crystal growth phase of the PVT process; and (iii) the selection of a set of process parameters and the specifications of the grown SiC crystal, which serve as a fingerprint of reproducible growth conditions (related to the selection and design of hot zone isolation components).
Authors
- Peter J. Wellmann (ORCID: https://orcid.org/0000-0002-2180-1507)
- Sven Strüber
- Johannes Steiner (ORCID: https://orcid.org/0000-0002-6686-7964)
- Jonas Ihle (ORCID: https://orcid.org/0000-0002-8224-3924)
- Julian Zöcklein
Institutions
- Friedrich-Alexander-Universität Erlangen-Nürnberg (DE)
Publication Details
- Journal
- Materials science forum
- Published
- 2025-09-04
- DOI
- https://doi.org/10.4028/p-qcdyf7
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00