Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs
This article explores the reliability, security, and sustainability of future 3D NAND flash SSDs. We discuss scaling challenges, their impact on reliability and radiation-induced vulnerabilities, along with potential countermeasures. Security concerns, including data sanitization and supply chain risks, are also discussed. Finally, we highlight sustainability issues related to storage carbon footprints. Our article emphasizes the need for innovative solutions to improve the resilience, security, and environmental impact of 3D NAND technology.
Authors
- Sudeep Pasricha (ORCID: https://orcid.org/0000-0002-0846-0066)
- Shyam Raghunathan
- Biswajit Ray (ORCID: https://orcid.org/0000-0002-5890-1368)
Institutions
- Micron (United States) (US)
- Colorado State University (US)
Publication Details
- Journal
- IEEE Design and Test
- Published
- 2025-09-04
- DOI
- https://doi.org/10.1109/mdat.2025.3606412
- Primary Topic
- Advanced Data Storage Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation