BEOL-Compatible Amorphous Oxide Semiconductor High-Voltage Transistors Achieving BFoM Beyond the GaAs Limit

Leveraging an offset top-gate (OTG) design and ALD-treated indium-tin oxide (ITO) channels, we present high-performance BEOL-compatible amorphous oxide semiconductor (AOS) high-voltage (HV) field-effect transistors (FETs). A long-channel (LC) FET features the highest Baliga’s figure of merit (BFoM) of 0.361 GW/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> among all AOS FETs, surpassing the one-dimensional GaAs limit. Additionally, a short-channel (SC) HV FET achieves a record-low specific on-state resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on, sp</sub>) of 9.15 × 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> mΩ·cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>. These results highlight the potential of AOS FETs for enabling high power density and efficiency in on-die power management and periphery applications for monolithic 3D integrated circuits (M3DICs).

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Publication Details

Journal
IEEE Electron Device Letters
Published
2025-09-04
DOI
https://doi.org/10.1109/led.2025.3606437
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00

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article

BEOL-Compatible Amorphous Oxide Semiconductor High-Voltage Transistors Achieving BFoM Beyond the GaAs Limit

Zijie Zheng, Xiao Gong, Geok Ing Ng, Kaizhen Han et al.
IEEE Electron Device Letters
Semiconductor materials and devices
article

BEOL-Compatible Amorphous Oxide Semiconductor High-Voltage Transistors Achieving BFoM Beyond the GaAs Limit

Zijie Zheng, Xiao Gong, Geok Ing Ng, Kaizhen Han, Xuanqi Chen, Hanchao Li, Dong Zhang, Yue Chen, Hanlin Xie, Chen Sun, Jiawei Xie, Rui Shao, Yuxuan Wang, Wei Shi
article en

Abstract

Leveraging an offset top-gate (OTG) design and ALD-treated indium-tin oxide (ITO) channels, we present high-performance BEOL-compatible amorphous oxide semiconductor (AOS) high-voltage (HV) field-effect transistors (FETs). A long-channel (LC) FET features the highest Baliga’s figure of merit (BFoM) of 0.361 GW/cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> among all AOS FETs, surpassing the one-dimensional GaAs limit. Additionally, a short-channel (SC) HV FET achieves a record-low specific on-state resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on, sp</sub>) of 9.15 × 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> mΩ·cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>. These results highlight the potential of AOS FETs for enabling high power density and efficiency in on-die power management and periphery applications for monolithic 3D integrated circuits (M3DICs).

IEEE Electron Device LettersVol. 46(11)
Agency for Science, Technology and Research (SG), National University of Singapore (SG), Nanyang Technological University (SG), Singapore Science Park (SG), Institute of Microelectronics (SG)
National University of Singapore, Ministry of Education - Singapore
Openalex Percentile: Top 78%
Semiconductor materials and devices
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