Reference-free measurement of photon emission intensities in the decay of standard radionuclides
Reliable X-ray emission intensities are essential for quantitative material analysis using X-ray spectrometry and for the efficiency calibration of energy-dispersive spectrometers. In order to improve the reliability of data, reference-free measurements were performed to determine X-ray emission intensities, along with their associated uncertainties, for a set of standard radionuclides in the energy range from 5.4 keV to 53.13 keV. Partial K X-ray emission intensities were determined for nine radionuclides, resulting in total K emission intensities, I<sub>XK</sub>, of 24.06(49)% for <sup>54</sup>Mn, 27.59(48)% for <sup>55</sup>Fe, 55.8(10)% for <sup>57</sup>Co, 37.4(9)% for <sup>65</sup>Zn, 60.0(7)% for <sup>85</sup>Sr, 59.0(7)% for <sup>88</sup>Y, 100.5(15)% for <sup>109</sup>Cd, 117.3(12)% for <sup>133</sup>Ba and 77.7(9)% for <sup>139</sup>Ce. In addition, γ-ray emission intensities were measured as 8.77(12)% for the 14.41 keV transition of <sup>57</sup>Co and 2.199(29)% for the 53.16 keV transition of <sup>133</sup>Ba. The results are in good agreement with existing data, although some differences were observed for a few radionuclides. For all investigated radionuclides, a fully traceable and reliable uncertainty budget has been provided.
Authors
- Yves Ménesguen (ORCID: https://orcid.org/0000-0003-2505-979X)
- Marie‐Christine Lépy (ORCID: https://orcid.org/0000-0002-1917-6802)
- Ablaihan Utepov (ORCID: https://orcid.org/0000-0002-1015-7285)
- Lucille Chambon
Institutions
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- Université Paris-Saclay (FR)
- Laboratoire d'Intégration des Systèmes et des Technologies (FR)
- Laboratoire National Henri Becquerel (FR)
Publication Details
- Journal
- Applied Radiation and Isotopes
- Published
- 2025-09-03
- DOI
- https://doi.org/10.1016/j.apradiso.2025.112159
- Primary Topic
- X-ray Spectroscopy and Fluorescence Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00