STATISTICAL SIGNIFICANCE OF DIFFERENCES MAGNESIUM DIBORIDE SUPERCONDUCTING TRANSITION TEMPERATURE MODELING

An extensive study has been done on a modeling approach that helps forecast the critical temperature of magnesium diboride (MgB2) materials. To determine the statistical importance of changes in modeling techniques, investigations must be able to consistently distinguish between systematic approach impacts and mistakes caused by modeling approach variance. In this study, researchers used analysis of variance and correlation analysis to determine the statistical significance of differences in modeling method variation. The resulting results were compared to the critical temperature estimated from lattice parameter change data using gaussian process regression (GPR), support vector machine (SVM), and linear regression with natural logarithm transformation (LRNLT).

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Publication Details

Journal
Suranaree Journal of Science and Technology
Published
2025-08-18
DOI
https://doi.org/10.55766/sujst11139
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
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article

STATISTICAL SIGNIFICANCE OF DIFFERENCES MAGNESIUM DIBORIDE SUPERCONDUCTING TRANSITION TEMPERATURE MODELING

Arpapong Changjan, Atirat Maksuwan, Warapol Kasemsan
Suranaree Journal of Science and Technology
Silicon Carbide Semiconductor Technologies
article

STATISTICAL SIGNIFICANCE OF DIFFERENCES MAGNESIUM DIBORIDE SUPERCONDUCTING TRANSITION TEMPERATURE MODELING

Arpapong Changjan, Atirat Maksuwan, Warapol Kasemsan
article en

Abstract

An extensive study has been done on a modeling approach that helps forecast the critical temperature of magnesium diboride (MgB2) materials. To determine the statistical importance of changes in modeling techniques, investigations must be able to consistently distinguish between systematic approach impacts and mistakes caused by modeling approach variance. In this study, researchers used analysis of variance and correlation analysis to determine the statistical significance of differences in modeling method variation. The resulting results were compared to the critical temperature estimated from lattice parameter change data using gaussian process regression (GPR), support vector machine (SVM), and linear regression with natural logarithm transformation (LRNLT).

Suranaree Journal of Science and TechnologyVol. 32(4)
Openalex Percentile: Top 78%
Silicon Carbide Semiconductor Technologies
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