High Performance AlN/GaN/AlN/GaN Double Channel Fin-HEMT for Ka-band Low Voltage Wireless Communication Applications
In this letter, a high performance AlN/GaN/AlN/GaN double channel Fin-HEMT (DCF-HEMT) is proposed for Ka-band low voltage mobile communica-tion applications. Attributed to Fin-structure, the fabricated DCF-HEMT demonstrated improved off-state gate control characteristics. With a low sheet resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SH</sub>) of 174 Ω/□ and the short source-drain spacing of 1.5 μm, the AlN/GaN/AlN/GaN DCF-HEMT delivered a high maximum current density of 2613 mA/mm. The off-state electric field was dispersed by double-channel structure, resulting in a low current collapse of about 7.5%. The load-pull meas-urements were carried out at 28 GHz and low operating voltages. The proposed DCF-HEMT delivered a peak pow-er-added efficiency (PAE) of 56.83% at 6 V and 61.55% at 10 V, when matched for maximum PAE. It also achieved a saturated power density (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SAT</sub>) of 3.13 W/mm at 6 V and 5.31 W/mm at 10 V, when matched for maximum <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OUT</sub>. Moreover, an OIP<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> of 34.07 dBm highlights the excellent linearity performance of the AlN/GaN/AlN/GaN DCF-HEMT. The ex-cellent results reveal the great potential of AlN/GaN/AlN/GaN DCF-HEMT in low voltage wireless communication applications at Ka-band.
Authors
- Yuwei Zhou (ORCID: https://orcid.org/0000-0003-1650-859X)
- Can Gong (ORCID: https://orcid.org/0000-0001-8974-7669)
- Minhan Mi (ORCID: https://orcid.org/0000-0002-6770-0090)
- Xingan Jiang (ORCID: https://orcid.org/0000-0001-9680-756X)
- Xiang Du (ORCID: https://orcid.org/0009-0006-6631-8590)
- Xiaohua Ma (ORCID: https://orcid.org/0000-0002-1331-6253)
- Yue Hao (ORCID: https://orcid.org/0000-0002-8081-2919)
- Tianhao Liu (ORCID: https://orcid.org/0000-0002-4098-6930)
- Ting Meng (ORCID: https://orcid.org/0009-0007-1769-559X)
- Xinyao Zhang (ORCID: https://orcid.org/0009-0006-9892-7999)
- Feiyang Chen (ORCID: https://orcid.org/0000-0002-5834-5656)
Institutions
- Xidian University (CN)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2025-09-02
- DOI
- https://doi.org/10.1109/led.2025.3604849
- Citations
- 1
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 1.26
Funders
- National Natural Science Foundation of China