High Performance AlN/GaN/AlN/GaN Double Channel Fin-HEMT for Ka-band Low Voltage Wireless Communication Applications

In this letter, a high performance AlN/GaN/AlN/GaN double channel Fin-HEMT (DCF-HEMT) is proposed for Ka-band low voltage mobile communica-tion applications. Attributed to Fin-structure, the fabricated DCF-HEMT demonstrated improved off-state gate control characteristics. With a low sheet resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SH</sub>) of 174 Ω/□ and the short source-drain spacing of 1.5 μm, the AlN/GaN/AlN/GaN DCF-HEMT delivered a high maximum current density of 2613 mA/mm. The off-state electric field was dispersed by double-channel structure, resulting in a low current collapse of about 7.5%. The load-pull meas-urements were carried out at 28 GHz and low operating voltages. The proposed DCF-HEMT delivered a peak pow-er-added efficiency (PAE) of 56.83% at 6 V and 61.55% at 10 V, when matched for maximum PAE. It also achieved a saturated power density (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SAT</sub>) of 3.13 W/mm at 6 V and 5.31 W/mm at 10 V, when matched for maximum <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OUT</sub>. Moreover, an OIP<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> of 34.07 dBm highlights the excellent linearity performance of the AlN/GaN/AlN/GaN DCF-HEMT. The ex-cellent results reveal the great potential of AlN/GaN/AlN/GaN DCF-HEMT in low voltage wireless communication applications at Ka-band.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2025-09-02
DOI
https://doi.org/10.1109/led.2025.3604849
Citations
1
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.26

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article

High Performance AlN/GaN/AlN/GaN Double Channel Fin-HEMT for Ka-band Low Voltage Wireless Communication Applications

Yuwei Zhou, Can Gong, Minhan Mi, Xingan Jiang et al.
1 citations
IEEE Electron Device Letters
GaN-based semiconductor devices and materials
1.26
article

High Performance AlN/GaN/AlN/GaN Double Channel Fin-HEMT for Ka-band Low Voltage Wireless Communication Applications

Yuwei Zhou, Can Gong, Minhan Mi, Xingan Jiang, Xiang Du, Xiaohua Ma, Yue Hao, Tianhao Liu, Ting Meng, Xinyao Zhang, Feiyang Chen
article en
1 citations

Abstract

In this letter, a high performance AlN/GaN/AlN/GaN double channel Fin-HEMT (DCF-HEMT) is proposed for Ka-band low voltage mobile communica-tion applications. Attributed to Fin-structure, the fabricated DCF-HEMT demonstrated improved off-state gate control characteristics. With a low sheet resistance (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SH</sub>) of 174 Ω/□ and the short source-drain spacing of 1.5 μm, the AlN/GaN/AlN/GaN DCF-HEMT delivered a high maximum current density of 2613 mA/mm. The off-state electric field was dispersed by double-channel structure, resulting in a low current collapse of about 7.5%. The load-pull meas-urements were carried out at 28 GHz and low operating voltages. The proposed DCF-HEMT delivered a peak pow-er-added efficiency (PAE) of 56.83% at 6 V and 61.55% at 10 V, when matched for maximum PAE. It also achieved a saturated power density (<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SAT</sub>) of 3.13 W/mm at 6 V and 5.31 W/mm at 10 V, when matched for maximum <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">P</i><sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OUT</sub>. Moreover, an OIP<sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> of 34.07 dBm highlights the excellent linearity performance of the AlN/GaN/AlN/GaN DCF-HEMT. The ex-cellent results reveal the great potential of AlN/GaN/AlN/GaN DCF-HEMT in low voltage wireless communication applications at Ka-band.

IEEE Electron Device LettersVol. 46(11)
Xidian University (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 18%
GaN-based semiconductor devices and materials
1.26
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