YOLOv8-Peaches: Lightweight Peach Surface Defect Detection Model
To enhance the accuracy and efficiency of peach surface defect detection while addressing suboptimal model performance and high complexity, this study proposes a lightweight improved model named YOLOv8-Peaches for precise identification of various surface defects including rot, wormholes, and damage. Specifically, the original C2f module is replaced with a Context Guided module to integrate local features with global contextual information, thereby improving dense defect detection capability; the downsampling operation is refined through an Adown module employing branch splitting and feature concatenation to reduce information loss while significantly lowering computational costs; and CIoU is substituted with Wise-IoU to dynamically allocate gradient gains, enhancing robustness against small and irregular defects. Extensive experiments conducted on our self-established Defective Surface Peaches Dataset (DSPD) demonstrate that the proposed model achieves 95.9% [email protected]—5.5% higher than the baseline YOLOv8n—while reducing Parameters and GFLOPs by 43.85% and 35.80%, respectively.
Authors
- Shuwen Yan (ORCID: https://orcid.org/0000-0002-9814-9406)
- Yongzhi Qi
- Pengfei He (ORCID: https://orcid.org/0000-0002-5727-7188)
- Yan-Yan Ding (ORCID: https://orcid.org/0009-0002-4413-9197)
- Xu Zhang (ORCID: https://orcid.org/0000-0002-0786-6128)
- Xia Liu (ORCID: https://orcid.org/0000-0002-5682-0521)
Institutions
- Yantai University (CN)
- Yantai Academy of Agricultural Sciences (CN)
Publication Details
- Published
- 2025-06-20
- DOI
- https://doi.org/10.1109/dmcis65888.2025.11138375
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China