Novel Post Silicon Validation Strategies for the New Era of UCIe Chiplets
The Universal Chiplet Interconnect Express (UCIe) standard marks a new era in SoC design by enabling the seamless integration of heterogeneous chiplets from multiple suppliers and process nodes into a single package. However, post-silicon validation of UCIe IP poses challenges due to the inpackage high-speed I/O links and lack of BKM's for this new technology. Our team validated Intel's first UCIe-compliant silicon, and in this paper, we outline the challenges and solutions across various post-silicon validation functions. Our learnings will help provide robust die-to-die link testing on the many upcoming products that have adopted our UCIe IP.
Authors
- A. Eashaan Rao
- Bhuvana Chandar
- Santhosh Kumar S
- Meghana Bukkapatnam
- Deepak Baliga
- Chad E Beach
Institutions
- Intel (United States) (US)
- Intel (India) (IN)
Publication Details
- Published
- 2025-07-20
- DOI
- https://doi.org/10.1109/itcindia66078.2025.11141599
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00