A Novel Method for the Processing of Optical Frequency Domain Reflectometry Traces

Optical frequency domain reflectometry (OFDR) is one of the key diagnostic tools for fiber optic components and circuits built on them. A low signal-to-noise ratio, resulting from the low intensity of backscattered signals, prevents the correct quantitative description of the medium parameters. Known methods of signal denoising, such as empirical mode decomposition, frequency filtering, and activation function dynamic averaging, make the signal smoother but introduce errors into its dynamic characteristics, changing the intensity of reflection peaks and distorting the backscattering level. We propose a method to reduce OFDR trace noise using elliptical arc fitting (EAF). The obtained results indicate that this algorithm efficiently processes both areas with and without contrasting back reflections, with zero distortion of Fresnel reflection peaks, and with zero attenuation error in regions without Fresnel reflections. At the same time, other methods distort reflection peaks by 14.2–42.6% and shift the correct level of Rayleigh scattering by 27.2–67.3%. Further work will be aimed at increasing the accuracy of the method and testing it with other types of data.