From Patch to Graph: Dual Graph Transformer Network for Few-Shot Metal Surface Defect Semantic Segmentation

Recently few-shot segmentation (FSS) of metal surface defects has been extensively developed. Most previous methods strive to achieve generalization through the pixel-based prototypes directly derived from support-query pairs. However, these methods are biased towards the global context without the intrinsic object details, thus hindering the recognition of minute defects. To this end, we propose a dual graph transformer network (DGTNet) to fully capture the aforementioned intrinsic details for accurate metal surface defect FSS. Specifically, in DGTNet, a patch-to-graph (P2G) encoder is firstly proposed to generate patch-based local and global graphs from dual perspective of support-query pairs, while simultaneously guiding global context and intrinsic details. Moreover, we equip DGTNet with a P2G transformer and a graph-to-mask (G2M) decoder to reason the relations among different nodes of the two graphs and generate the pixel-level mask of the query images, respectively. Our DGTNet also manifests remarkable adaptability within the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">K</i>-shot FSS setting. Extensive experiments on metal surface defect datasets show that DGTNet yields superior performances under both 1-shot and 5-shot settings. Our source code is available at: https://github.com/DingH2E/DGTNet.

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Journal
IEEE Access
Published
2025-01-01
DOI
https://doi.org/10.1109/access.2025.3604553
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00

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article

From Patch to Graph: Dual Graph Transformer Network for Few-Shot Metal Surface Defect Semantic Segmentation

Jiyan Zhang, Yi-Hong Liao, Yanfang Liu, Hanze Ding et al.
IEEE Access
Integrated Circuits and Semiconductor Failure Analysis
article

From Patch to Graph: Dual Graph Transformer Network for Few-Shot Metal Surface Defect Semantic Segmentation

Jiyan Zhang, Yi-Hong Liao, Yanfang Liu, Hanze Ding, Ming Peng
article en

Abstract

Recently few-shot segmentation (FSS) of metal surface defects has been extensively developed. Most previous methods strive to achieve generalization through the pixel-based prototypes directly derived from support-query pairs. However, these methods are biased towards the global context without the intrinsic object details, thus hindering the recognition of minute defects. To this end, we propose a dual graph transformer network (DGTNet) to fully capture the aforementioned intrinsic details for accurate metal surface defect FSS. Specifically, in DGTNet, a patch-to-graph (P2G) encoder is firstly proposed to generate patch-based local and global graphs from dual perspective of support-query pairs, while simultaneously guiding global context and intrinsic details. Moreover, we equip DGTNet with a P2G transformer and a graph-to-mask (G2M) decoder to reason the relations among different nodes of the two graphs and generate the pixel-level mask of the query images, respectively. Our DGTNet also manifests remarkable adaptability within the <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">K</i>-shot FSS setting. Extensive experiments on metal surface defect datasets show that DGTNet yields superior performances under both 1-shot and 5-shot settings. Our source code is available at: https://github.com/DingH2E/DGTNet.

IEEE AccessVol. 13
Longyan University (CN)
Natural Science Foundation of Fujian Province
Openalex Percentile: Top 78%
Integrated Circuits and Semiconductor Failure Analysis
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From Patch to Graph: Dual Graph Transformer Network for Few-Shot Metal Surface Defect Semantic Segmentation — Jiyan Zhang, Yi-Hong Liao, et al. · IEEE Access (2025) | TGRS Research Map | TGRS