Deep-learning-based rapid wavefront sensor using a line-scan camera
Abstract We present a rapid wavefront sensor based on machine learning and using a line-scan camera. The object light wave propagates through a scattering medium. In our method, the scattered light wave undergoes a series of preconditioning steps. The resultant light wave, in which only the wavefront aberration component is emphasized and the reference object light wave is removed, is captured as one-dimensional data using line focusing optics. The captured data are trained by a convolutional neural network, and the trained network can estimate the Zernike coefficients without iterative calculations. The proposed method achieves significantly faster measurement compared to a two-dimensional sensor. The proposed method was experimentally demonstrated, as a proof of concept, using a line-scan camera and a preconditioning method that we designed.
Authors
- Yohei Nishizaki
- Katsuhisa Kitaguchi
- Mamoru Saito
- Jun Tanida (ORCID: https://orcid.org/0000-0002-3106-8062)
Institutions
- Osaka Research Institute of Industrial Science and Technology (JP)
- The University of Osaka (JP)
Publication Details
- Journal
- Optical Review
- Published
- 2025-09-01
- DOI
- https://doi.org/10.1007/s10043-025-00999-4
- Primary Topic
- Advanced Optical Sensing Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Japan Society for the Promotion of Science