X-ray near-field multi-slice ptychography for in-situ imaging

In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.

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Publication Details

Journal
Scientific Reports
Published
2025-09-01
DOI
https://doi.org/10.1038/s41598-025-15610-8
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

X-ray near-field multi-slice ptychography for in-situ imaging

Martin Seyrich, Ulrich Vogt, Karolina Stachnik, Christian G. Schroer et al.
Scientific Reports
Advanced X-ray Imaging Techniques
article

X-ray near-field multi-slice ptychography for in-situ imaging

Martin Seyrich, Ulrich Vogt, Karolina Stachnik, Christian G. Schroer, Peter Gawlitza, Andreas Schropp, Sarah-Alexandra Hussak, Dorota Koziej, Lukas Grote, Mattias Åstrand, Sven Niese, Felix Wittwer, Sina Röper, J. Voß
article en

Abstract

In-situ imaging of chemical reactions can provide valuable insight into nanoparticle growth and structural evolution. Hard X-ray imaging is an excellent tool for this purpose, as it combines high spatial resolution with high penetration depth, allowing for realistic reaction environments. While far-field ptychography is a well-established method at synchrotron radiation sources, its near-field analog has received less attention. In this work we show that near-field multi-slice ptychography is a competitive method for high-resolution in-situ imaging by studying the formation of gold nanocages via galvanic replacement. Our work extends near-field X-ray ptychography to sub-50 nm spatial resolution by using multilayer Laue lenses. These high numerical aperture optics enable to distinguish sample layers that are separated by less than 100 µm by multi-slicing techniques.

Scientific ReportsVol. 15(1)
Lawrence Berkeley National Laboratory (US), Universität Hamburg (DE), Deutsches Elektronen-Synchrotron DESY (DE), AXO Dresden (Germany) (DE), National Energy Research Scientific Computing Center (US), Fraunhofer Institute for Material and Beam Technology (DE), KTH Royal Institute of Technology (SE)
Bundesministerium für Bildung und Forschung, Vetenskapsrådet, Röntgen-Ångström Cluster, Deutsches Elektronen-Synchrotron
Openalex Percentile: Top 70%
Advanced X-ray Imaging Techniques
DOIOpen Access PDFOpenAlex
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