High-Resolution and High-Speed Inspection Technology for CT-Type Automated X-Ray Inspection Systems

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Publication Details

Journal
Journal of The Japan Institute of Electronics Packaging
Published
2025-08-31
DOI
https://doi.org/10.5104/jiep.28.570
Primary Topic
Advanced X-ray and CT Imaging
Type
article
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article

High-Resolution and High-Speed Inspection Technology for CT-Type Automated X-Ray Inspection Systems

Makoto Shichiro
Journal of The Japan Institute of Electronics Packaging
Advanced X-ray and CT Imaging
article

High-Resolution and High-Speed Inspection Technology for CT-Type Automated X-Ray Inspection Systems

Makoto Shichiro
article en

Abstract

No abstract available for this paper.
Journal of The Japan Institute of Electronics PackagingVol. 28(6)
Omron (Japan) (JP)
Openalex Percentile: Top 78%
Advanced X-ray and CT Imaging
DOISourceOpenAlex
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High-Resolution and High-Speed Inspection Technology for CT-Type Automated X-Ray Inspection Systems — Makoto Shichiro · Journal of The Japan Institute of Electronics Packaging (2025) | TGRS Research Map | TGRS