Modeling of the Pantograph Contact Strip Materials using X-ray CT Images and Calculation of their Material Properties by Finite-Element-Method-based Homogenization

Pantograph contact strip materials are typically composed of multiple materials, with their properties significantly influenced by their microstructure. Estimating material properties through computer simulations based on microstructure-informed models can be valuable for designing novel contact strip materials with desired characteristics or accelerating material development by reducing the need for physical prototypes. In this study, we developed an image-based finite element model using X-ray computed tomography for three types of pantograph contact strip materials. Using these models, we computed the equivalent elastic modulus, thermal conductivity, and electrical resistivity through the homogenization method. The majority of the computed values showed better agreement with experimentally measured values compared to those estimated using the rule of mixtures. Additionally, we demonstrated several applications of the model for copper-infiltrated carbon.