NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization

As transistor sizes continue shrinking, impacts of variability has become ever more paramount in circuit design and manufacturing. Their accurate representations in model cards help save design margins and provide appropriate guidelines in design technology co-optimization (DTCO). To address such a challenge, we propose a novel machine learning framework, Normalizing Flow-Based Joint Generative Model (NFGen), which generates a comprehensive model library from a limited number of model cards. Unlike traditional generative methods that focus on the marginal distribution of model card parameters, NFGen is the first model to approximate their joint distribution, which includes information on their correlation and thus enables closer representation of variability effects. In addition, we introduce two similarity metrics to rigorously evaluate the quality of generated model cards. Experimental results show that NFGen reduces overall error by 2x to 8x compared to state-of-the-art methods, validating its superiority in variability-aware DTCO.

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Publication Details

Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
2025-08-29
DOI
https://doi.org/10.1109/tcad.2025.3604349
Primary Topic
Manufacturing Process and Optimization
Type
article
Field-Weighted Citation Impact
0.00

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article

NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization

Runsheng Wang, Weisheng S. Zhao, Zhiyu Wang, Peng Wang et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Manufacturing Process and Optimization
article

NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization

Runsheng Wang, Weisheng S. Zhao, Zhiyu Wang, Peng Wang, Tao Zou, Wen Shi, Yijiao Wang, A. Asenov, Zhiwei Chen, Z. L. Dou
article en

Abstract

As transistor sizes continue shrinking, impacts of variability has become ever more paramount in circuit design and manufacturing. Their accurate representations in model cards help save design margins and provide appropriate guidelines in design technology co-optimization (DTCO). To address such a challenge, we propose a novel machine learning framework, Normalizing Flow-Based Joint Generative Model (NFGen), which generates a comprehensive model library from a limited number of model cards. Unlike traditional generative methods that focus on the marginal distribution of model card parameters, NFGen is the first model to approximate their joint distribution, which includes information on their correlation and thus enables closer representation of variability effects. In addition, we introduce two similarity metrics to rigorously evaluate the quality of generated model cards. Experimental results show that NFGen reduces overall error by 2x to 8x compared to state-of-the-art methods, validating its superiority in variability-aware DTCO.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsVol. 45(4)
Peking University (CN), University of Glasgow (GB), Beihang University (CN)
National Natural Science Foundation of China, National Science and Technology Major Project
Industry, innovation and infrastructure
Openalex Percentile: Top 68%
Manufacturing Process and Optimization
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NFGen: Normalizing Flow-Based Joint Generative Model for Variability-Aware Design Technology Co-Optimization — Runsheng Wang, Weisheng S. Zhao, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2025) | TGRS Research Map | TGRS