Thickness–dependent charge transport across CdO/La0.3Ca0.7MnO3 n–n junction interfaces

Understanding the charge transport across functional oxide interfaces is vital for designing thin film devices for applications in spintronics, sensors, uncooled bolometers, p–n and n–n junctions, capacitors, diodes, field–effect and memory devices, and neuromorphic systems. In this work, n–n junction–based CdO/La 0.3 Ca 0.7 MnO 3 (CdO/LCMO) heterostructures with varying LCMO layer thicknesses were fabricated on Al 2 O 3 substrates using a sol–gel assisted chemical solution deposition (CSD) technique. Temperature–dependent resistivity measurements were performed to investigate the charge transport behaviour across the junctions. All heterostructures exhibit insulating transport with two distinct electronic transitions: the charge–ordered transition (T CO ) and the antiferromagnetic transition (T N ) at lower temperatures. Mott–type variable range hopping (VRH) was identified as the dominant transport mechanism, enabling estimation of key parameters such as the density of states near the Fermi level N(E f ), average hopping distance, and hopping energy. The temperature coefficient of resistance (TCR) was also evaluated, with high values near room temperature indicating strong potential for uncooled bolometer and thermal sensor applications. The observed sharp resistivity change due to the charge–ordering transition is directly responsible for enhanced TCR. The study further clarifies the influence of LCMO layer thickness on transport properties and TCR behaviour, establishing thickness as an effective tuning parameter. Additionally, these heterostructures serve as model systems for exploring charge transport at n–n junctions involving a narrow–bandgap semiconductor (CdO) and a charge–ordered complex oxide (LCMO), providing a versatile platform for phase–engineered oxide electronics. • n-n junction based CdO/La 0.3 Ca 0.7 MnO 3 heterostructures fabricated using CSD method. • La 0.3 Ca 0.7 MnO 3 manganite exhibits exotic phase of charge ordered insulator state. • Temperature dependent resistivity measurement shows T CO and T N transitions. • Estimated average hopping distance and hopping energy with temperature dependency. • Highest TCR value found near room temperature for uncooled bolometer application.

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Publication Details

Journal
Materials Science in Semiconductor Processing
Published
2025-08-31
DOI
https://doi.org/10.1016/j.mssp.2025.110011
Primary Topic
Magnetic and transport properties of perovskites and related materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Thickness–dependent charge transport across CdO/La0.3Ca0.7MnO3 n–n junction interfaces

Keval Gadani, Himitri Trivedi, Dhiraj Devidas Bhatia, K.N. Rathod et al.
4 links
Materials Science in Semiconductor Processing
Magnetic and transport properties of perovskites and related materials
article

Thickness–dependent charge transport across CdO/La0.3Ca0.7MnO3 n–n junction interfaces

Keval Gadani, Himitri Trivedi, Dhiraj Devidas Bhatia, K.N. Rathod, Davit Dhruv, Mayur Parmar, Sukriti Hans, P.S. Solanki, Mukesh Ranjan, Bharavi Hirpara, Bhargav Rajyaguru, Nilesh Shah, C.M. Panchasara, Sanjay Kosara, Nisarg Raval
article en

Abstract

Understanding the charge transport across functional oxide interfaces is vital for designing thin film devices for applications in spintronics, sensors, uncooled bolometers, p–n and n–n junctions, capacitors, diodes, field–effect and memory devices, and neuromorphic systems. In this work, n–n junction–based CdO/La 0.3 Ca 0.7 MnO 3 (CdO/LCMO) heterostructures with varying LCMO layer thicknesses were fabricated on Al 2 O 3 substrates using a sol–gel assisted chemical solution deposition (CSD) technique. Temperature–dependent resistivity measurements were performed to investigate the charge transport behaviour across the junctions. All heterostructures exhibit insulating transport with two distinct electronic transitions: the charge–ordered transition (T CO ) and the antiferromagnetic transition (T N ) at lower temperatures. Mott–type variable range hopping (VRH) was identified as the dominant transport mechanism, enabling estimation of key parameters such as the density of states near the Fermi level N(E f ), average hopping distance, and hopping energy. The temperature coefficient of resistance (TCR) was also evaluated, with high values near room temperature indicating strong potential for uncooled bolometer and thermal sensor applications. The observed sharp resistivity change due to the charge–ordering transition is directly responsible for enhanced TCR. The study further clarifies the influence of LCMO layer thickness on transport properties and TCR behaviour, establishing thickness as an effective tuning parameter. Additionally, these heterostructures serve as model systems for exploring charge transport at n–n junctions involving a narrow–bandgap semiconductor (CdO) and a charge–ordered complex oxide (LCMO), providing a versatile platform for phase–engineered oxide electronics. • n-n junction based CdO/La 0.3 Ca 0.7 MnO 3 heterostructures fabricated using CSD method. • La 0.3 Ca 0.7 MnO 3 manganite exhibits exotic phase of charge ordered insulator state. • Temperature dependent resistivity measurement shows T CO and T N transitions. • Estimated average hopping distance and hopping energy with temperature dependency. • Highest TCR value found near room temperature for uncooled bolometer application.

Materials Science in Semiconductor ProcessingVol. 200
Uppsala University (SE), Saurashtra University (IN), Indian Institute of Technology Gandhinagar (IN), Indian Institute of Teacher Education (IN), Institute for Plasma Research (IN)
Gujarat Council on Science and Technology, Department of Science and Technology, Ministry of Science and Technology, India, Saurashtra University
Openalex Percentile: Top 85%
Magnetic and transport properties of perovskites and related materials
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