Sulfur Vacancy‐Engineered NiCoB/ZnIn <sub>2</sub> S <sub>4</sub> Schottky Junctions for Synergistic Charge Separation and Photocatalytic Hydrogen Evolution

Abstract The strategic design of heterostructured interfaces between semiconductors significantly improves charge carrier mobility, offering a viable pathway to boost hydrogen generation efficiency in photocatalytic systems. In this study, Coulombic interaction‐guided assembly strategy is employed to design a novel composite photocatalyst, which is composed of sulfur vacancy‐engineered ZnIn 2 S 4 (ZnIn 2 S 4 ‐Vs)and NiCoB,NiCoB/ZnIn 2 S 4 ‐Vs. With visible light irradiation, the composite demonstrated H 2 production efficiency of 9352.63 µmol g −1 h −1 , surpassing the efficiencies of ZnIn 2 S 4 ‐Vs and NiCoB counterparts by 6 times and 7 times, respectively. This remarkable rising in photocatalytic hydrogen production efficiency arises from three pivotal contributors: 1) The composite material exhibited a 3D flower‐like microsphere morphology, which remarkably boosted the density of active sites; 2) Light reflection and scattering effects induced by the self‐assembled 2D nanosheets constituting the nanoflower architecture effectively enhance the harvesting capability of the composite materials; 3) Schottky heterojunction formed at the interface between NiCoB and ZnIn 2 S 4 ‐Vs facilitates charge carrier separation, thereby elevating photocatalytic activity. This research provided a novel paradigm for developing high‐performance photocatalysts via a tripartite strategy integrating defect engineering, Schottky heterojunction design, and metal catalysis, offering an innovative pathway to optimize charge dynamics and catalytic efficiency.

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Publication Details

Journal
Advanced Sustainable Systems
Published
2025-08-29
DOI
https://doi.org/10.1002/adsu.202500823
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
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article

Sulfur Vacancy‐Engineered NiCoB/ZnIn 2 S 4 Schottky Junctions for Synergistic Charge Separation and Photocatalytic Hydrogen Evolution

Tiantian Bai, Zhiliang Jin, Qing Chen, Yaoyao Chen et al.
Advanced Sustainable Systems
Chalcogenide Semiconductor Thin Films
article

Sulfur Vacancy‐Engineered NiCoB/ZnIn 2 S 4 Schottky Junctions for Synergistic Charge Separation and Photocatalytic Hydrogen Evolution

Tiantian Bai, Zhiliang Jin, Qing Chen, Yaoyao Chen, Qin Luo
article en

Abstract

Abstract The strategic design of heterostructured interfaces between semiconductors significantly improves charge carrier mobility, offering a viable pathway to boost hydrogen generation efficiency in photocatalytic systems. In this study, Coulombic interaction‐guided assembly strategy is employed to design a novel composite photocatalyst, which is composed of sulfur vacancy‐engineered ZnIn 2 S 4 (ZnIn 2 S 4 ‐Vs)and NiCoB,NiCoB/ZnIn 2 S 4 ‐Vs. With visible light irradiation, the composite demonstrated H 2 production efficiency of 9352.63 µmol g −1 h −1 , surpassing the efficiencies of ZnIn 2 S 4 ‐Vs and NiCoB counterparts by 6 times and 7 times, respectively. This remarkable rising in photocatalytic hydrogen production efficiency arises from three pivotal contributors: 1) The composite material exhibited a 3D flower‐like microsphere morphology, which remarkably boosted the density of active sites; 2) Light reflection and scattering effects induced by the self‐assembled 2D nanosheets constituting the nanoflower architecture effectively enhance the harvesting capability of the composite materials; 3) Schottky heterojunction formed at the interface between NiCoB and ZnIn 2 S 4 ‐Vs facilitates charge carrier separation, thereby elevating photocatalytic activity. This research provided a novel paradigm for developing high‐performance photocatalysts via a tripartite strategy integrating defect engineering, Schottky heterojunction design, and metal catalysis, offering an innovative pathway to optimize charge dynamics and catalytic efficiency.

Advanced Sustainable SystemsVol. 9(10)
State Ethnic Affairs Commission (CN), North Minzu University (CN)
Openalex Percentile: Top 78%
Chalcogenide Semiconductor Thin Films
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