Spectroscopy Characterization of Irradiated Perovskite Films

External radiative efficiency (ERE) and photoluminescence (PL) are facile non-contact methods of semiconductor material characterization which provide a direct indicator of device performance. In this work ERE and PL are used to characterize double cation and triple cation perovskite films, specifically looking at degradation and radiation effects. In irradiated perovskite samples ERE and PL are reduced, indicating degradation related to internal material defects. Light degradation results have shown increases in PL and ERE values thought to be associated with phase segregation. Ongoing work will examine light degradation at various wavelengths, measure any phase segregation, and characterize radiation effects. In addition, models used to directly relate ERE values to solar cell efficiency will be specifically explored for perovskite solar cells.