Enhanced Fault Detection in High-Efficiency PV Technologies Using DLIT and EL Imaging Techniques

The continuous development of latest photovoltaic (PV) technologies, such as Interdigitated Back Contact (IBC) and Passivated Emitter and Rear Cell (PERC) modules, has driven improvements in efficiency and performance. However, the long-term reliability of these modules in harsh environmental conditions, such as the extreme heat and humidity characteristic of the Middle East, remains a critical concern. Identifying and understanding the degradation mechanisms under these conditions is essential for optimizing PV module design and ensuring operational durability. This study examines the impact of accelerated indoor damp heat (DH) aging tests on the performance and reliability of commercial IBC and PERC PV modules. Non-destructive imaging methods, such as Electroluminescence (EL) and Dark Lock-in Thermography (DLIT), detect and assess defects arising during the aging process. These cutting-edge techniques enable detailed visualization of thermal and electrical irregularities, offering valuable insights into the degradation modes.