Observation of High PV Durability Under Harsh Sequential Stress
We study durability of photovoltaic (PV) components relevant to the increasingly popular glass/glass module packaging, using mini-modules with EVA, POE, and EPE encapsulants and full- versus half-cut cells. We use sequential stress testing with repeated cycles of damp heat, full-spectrum (UV-containing) light exposure, thermal cycling, and humidity freeze. We compare this indoor sequential stress to outdoor aging. Despite the harsh stress procedure, we observe <5 rel.% power loss for all materials tested, demonstrating the potential for high durability when quality PV module materials are used.
Authors
- Dana B. Kern (ORCID: https://orcid.org/0000-0003-0814-8723)
- Soňa Uličná (ORCID: https://orcid.org/0000-0001-5287-7179)
- Laura T. Schelhas (ORCID: https://orcid.org/0000-0003-2299-1864)
- Rebecca B. Wai (ORCID: https://orcid.org/0000-0001-6944-2235)
- John S. Mangum (ORCID: https://orcid.org/0000-0002-5926-7565)
- Jimmy Newkirk
- David C. Miller
- Dennice M. Roberts (ORCID: https://orcid.org/0000-0003-0933-4587)
- Michael Owen‐Bellini (ORCID: https://orcid.org/0000-0002-4551-8124)
- Kent Terwilliger
- Steve Johnston
- Paul F. Ndione
- Xavier Hanna
Institutions
- National Laboratory of the Rockies (US)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.1109/pvsc59419.2025.11132804
- Primary Topic
- Photovoltaic System Optimization Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00