Corrosive Potential-Induced Degradation of Perovskite Solar Cells

Potential-induced degradation (PID) poses a critical challenge to the long-term performance and reliability of photovoltaic (PV) modules in the field, often causing substantial efficiency losses within a short timeframe. In PSCs, recent studies have shown that Naâ•<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">◦</sup> migration can induce shunting paths and exacerbate defect recombination in the perovskite absorber layer. However, corrosive PID (PID-c), a degradation mechanism commonly associated with interactions involving water and oxygen in other thin-film technologies, has yet to be reported for PSCs. This study revealed the mechanisms behind corrosive potential-induced degradation (PID) in perovskite solar cells (PSCs). By examining both laboratory-scale small cells and minimodules subjected to PID stress and air exposure, we observed that the extent of corrosion varies based on the type of conductive glass used. The degradation is driven by chemical reactions involving migrated sodium ions, tin oxide in the conductive layer, and atmospheric moisture. While minimodules exhibited slower degradation compared to small cells, significant declines in photoluminescence and current-voltage performance were observed. These findings provide critical insights into PID corrosion, paving the way for strategies to enhance PSC durability and the study of other PID mechanisms.