The Effect of Grain Boundary Misorientation Angle on Selenium Diffusion in CdSe<sub>x</sub>Te<sub>1-x</sub> Solar Cells

The effect of grain boundary (GB) misorientation on selenium (Se) diffusion and bandgap grading in cadmium telluride (CdTe) devices incorporating a CdSexTe1-x alloy has been investigated using high-resolution cathodoluminescence (CL) and electron backscatter diffraction (EBSD). Using CL, we map the bandgap variations and the Selenium concentration across the absorber. EBSD provides corresponding information on grain boundary orientation from the same cross-section of the device. This correlative analysis reveals that larger grain boundary misorientation angles promote greater Se diffusion, resulting in a lower bandgap (BG) in grains associated with this type of grain boundary.

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Published
2025-06-08
DOI
https://doi.org/10.1109/pvsc59419.2025.11132498
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
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article

The Effect of Grain Boundary Misorientation Angle on Selenium Diffusion in CdSexTe1-x Solar Cells

Sam Machin, John M. Walls, Stuart Robertson, Zhaoxia Zhou et al.
Chalcogenide Semiconductor Thin Films
article

The Effect of Grain Boundary Misorientation Angle on Selenium Diffusion in CdSexTe1-x Solar Cells

Sam Machin, John M. Walls, Stuart Robertson, Zhaoxia Zhou, Eric Colegrove, Matthew O. Reese, Joshua Brown, Kieran M. Curson, Xiaolei Liu, Robert L. Morrissey
article en

Abstract

The effect of grain boundary (GB) misorientation on selenium (Se) diffusion and bandgap grading in cadmium telluride (CdTe) devices incorporating a CdSexTe1-x alloy has been investigated using high-resolution cathodoluminescence (CL) and electron backscatter diffraction (EBSD). Using CL, we map the bandgap variations and the Selenium concentration across the absorber. EBSD provides corresponding information on grain boundary orientation from the same cross-section of the device. This correlative analysis reveals that larger grain boundary misorientation angles promote greater Se diffusion, resulting in a lower bandgap (BG) in grains associated with this type of grain boundary.

National Laboratory of the Rockies (US), Loughborough University (GB)
Openalex Percentile: Top 78%
Chalcogenide Semiconductor Thin Films
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