Reliability Analysis of ETL/Perovskite/HTL Interface Cracks on Perovskite Solar Cell Performance through FEM

This research employs Finite Element Method (FEM) analysis to investigate the impact of interface cracks (delamination) on the performance of Perovskite solar cells. To evaluate the reliability of perovskite solar cells with interface cracks, varying degrees of cracks (20% to 80%) were introduced at the Perovskite/HTL and Perovskite/ETL interfaces. Simulation results demonstrate that the interface crack primarily reduces the short-circuit current (Jsc), with a less pronounced effect on the open-circuit voltage (Voc). Furthermore, a crack at the Perovskite/ETL interface leads to greater performance degradation than a crack at the Perovskite/HTL interface, which agrees with other literature.