Voltage loss analysis of CdSeTe solar cells at maximum power point

Much of the research effort in CdSeTe photovoltaics is aimed at improving cell voltage at open-circuit. However, solar cells operate at their maximum power point (mppt), where the breakdown of voltage losses will be different to at open-circuit. We have developed a camera-based PL system that can measure the implied JV curve of CdSeTe solar cells, enabling voltage loss analysis at mppt. An implied JV curve is produced at each pixel, with a resolution of tens of microns. We use the system to map the implied efficiency and implied fill factor across a CdSeTe substrate. JV and suns JV measurements can also be performed in the system, so that the implied JV curves can be compared to actual JV and pseudo JV curves to provide more detailed loss analysis. We use the system to compare the breakdown of voltage losses at mppt to those at open circuit for a >19% efficient CdSeTe cell.

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Publication Details

Published
2025-06-08
DOI
https://doi.org/10.1109/pvsc59419.2025.11132389
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
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article

Voltage loss analysis of CdSeTe solar cells at maximum power point

Michael J. Heben, Adam B. Phillips, Nadeesha Katakumbura, Thomas Fiducia et al.
Chalcogenide Semiconductor Thin Films
article

Voltage loss analysis of CdSeTe solar cells at maximum power point

Michael J. Heben, Adam B. Phillips, Nadeesha Katakumbura, Thomas Fiducia, Kara Buehrer Kile, Jared D. Friedl, Randy J. Ellingson, Ebin Bastola, Prabodica Kaluarachchi, Adasi Abudulimu
article en

Abstract

Much of the research effort in CdSeTe photovoltaics is aimed at improving cell voltage at open-circuit. However, solar cells operate at their maximum power point (mppt), where the breakdown of voltage losses will be different to at open-circuit. We have developed a camera-based PL system that can measure the implied JV curve of CdSeTe solar cells, enabling voltage loss analysis at mppt. An implied JV curve is produced at each pixel, with a resolution of tens of microns. We use the system to map the implied efficiency and implied fill factor across a CdSeTe substrate. JV and suns JV measurements can also be performed in the system, so that the implied JV curves can be compared to actual JV and pseudo JV curves to provide more detailed loss analysis. We use the system to compare the breakdown of voltage losses at mppt to those at open circuit for a >19% efficient CdSeTe cell.

University of Toledo (US)
Affordable and clean energy
Openalex Percentile: Top 78%
Chalcogenide Semiconductor Thin Films
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Voltage loss analysis of CdSeTe solar cells at maximum power point — Michael J. Heben, Adam B. Phillips, et al. · (2025) | TGRS Research Map | TGRS