Back-Contact Impact on Spectral Photoluminescence in CdTe Films

Spectral photoluminescence measurements were done, from the glass side, on CdTe absorber films with several different back-contact layers to better understand the effect the back-contact has on photoluminescence. During these measurements we focused analysis on the change in subband-gap photoluminescence signal to inspect the impact on defect-assisted recombination. Results indicate that even with a thick absorber, the back-contact can have a large impact on the photoluminescence signal.

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Published
2025-06-08
DOI
https://doi.org/10.1109/pvsc59419.2025.11132979
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
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article

Back-Contact Impact on Spectral Photoluminescence in CdTe Films

Camden Kasik, Daniel Shaw, James R. Sites
Advanced Semiconductor Detectors and Materials
article

Back-Contact Impact on Spectral Photoluminescence in CdTe Films

Camden Kasik, Daniel Shaw, James R. Sites
article en

Abstract

Spectral photoluminescence measurements were done, from the glass side, on CdTe absorber films with several different back-contact layers to better understand the effect the back-contact has on photoluminescence. During these measurements we focused analysis on the change in subband-gap photoluminescence signal to inspect the impact on defect-assisted recombination. Results indicate that even with a thick absorber, the back-contact can have a large impact on the photoluminescence signal.

Colorado State University (US)
U.S. Department of Energy
Openalex Percentile: Top 78%
Advanced Semiconductor Detectors and Materials
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