FMEA analysis of slot-die coating defects on the performance of 2T perovskite/silicon tandem solar cells fabricated on industry-relevant wafers
Perovskite/silicon tandem solar cells have demonstrated rapid progression of power conversion efficiency in the past decade. However, little effort has focused on integrating scalable deposition technique to industry-relevant silicon bottom cells. In particular, the relationship between coating defects and tandem cell performance loss is rarely reported. First, we discuss the effect of the silicon substrate non-ideality (trenches and texturing) on the perovskite film properties. Then, we perform a rigorous defect categorization using PL images and SEM to classify coating defects into 9 categories. Finally, we present a Failure Mode and Effects Analysis (FMEA) that reveals the three main defects causing performance loss in 2-terminal perovskite-silicon solar cells.
Authors
- Abdulwahab Alasfour
- David Quispe (ORCID: https://orcid.org/0000-0002-5956-0833)
- Zachary C. Holman (ORCID: https://orcid.org/0000-0002-0694-1341)
- Zhengshan J. Yu (ORCID: https://orcid.org/0000-0002-4305-5912)
- Mathilde Fievez (ORCID: https://orcid.org/0000-0001-6837-3645)
- Zach Leuty
Institutions
- Silicon Labs (United States) (US)
Publication Details
- Published
- 2025-06-08
- DOI
- https://doi.org/10.1109/pvsc59419.2025.11132814
- Primary Topic
- Silicon and Solar Cell Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00